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Dr. Tamar Berenblum (Chair)

Research Director

HUJI Cyber Security Research Center (H-CSRC) – Cyber Law Program

Hebrew University of Jerusalem

Tamar Berenblum is a Post-Doc Research Fellow at the Netherlands Institute for the Study of Crime and Law Enforcement (NSCR), Netherlands and at the HUJI Cyber Security Research Center (H-CSRC), the Rachel and Selim Benin School of Computer Science and Engineering, the Hebrew University of Jerusalem, Israel. Tamar is the research director of the HUJI Cyber Security Research Center (H-CSRC) – Cyber Law Program, Faculty of Law, the Hebrew University of Jerusalem, Israel. Tamar's research interests include victimology, sociology of knowledge, cybercrime and social control. Her Doctoral thesis at the Hebrew University of Jerusalem, Israel titled "The Internet as a Sphere of Social Control" examines the internet both as a sphere for social control and as a tool for such control over deviant activities. The study focuses on mapping and analyzing online social control practices and the applicability of social control theories and policies in the context of cyberspace. Tamar has research experience both as a project manager and as a CoPI. She is part of research teams studying deterrence, prevention and regulation of computer crimes, online-shaming, developments in the field of victimology and the effect of language accessibility of the legal proceeding. In addition, Tamar serves as a public representative in Parole Committees of the Court Administration.


Journal Articles

  • Maimon, D., Wilson, T., Ren, W., & Berenblom, T. (2015). On the Relevance of Spatial and Temporal Dimensions in Assessing Computer Susceptibility to System Trespassing Incidents. British Journal of Criminology.

Conference Proceedings

  • Rechavi, A., Berenblum, T., Maimon, D., & Sevilla, I. S. (2015, August). Hackers topology matter geography: Mapping the dynamics of repeated system trespassing events networks. In Advances in Social Networks Analysis and Mining (ASONAM), 2015 IEEE/ACM International Conference on (pp. 795-804). IEEE.‏

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